Surfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry
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3D surface metrology - Microscopy > ULTRAObjective
ULTRAObjective
Near field Measuring head AFM/SPM
- Compatible with most optical microscopes
- Compact
- Full range from 20 µm to 80 µm
- Compatible with most optical microscopes
- Compact
- Full range from 20 µm to 80 µm
EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.