Surfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry
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3D surface metrology - Microscopy > Contrôle qualité
Contrôle qualité
Quality Control
Microscopy using interferométric, confocal or near field techniques offers a spectrum of investigation of your components quality and surface functionality as proof or assembly.
Surface quality becomes a manufacturing objective, and zero default a quality insurance. To answer all these needs our systems offers flexibility and automatism to fulfil the requirement as close as possible to the manufacturing areas.
- Roughness
- Default detection
- Planarity, co-planarity
- Dimensional measurement
Microscopy using interferométric, confocal or near field techniques offers a spectrum of investigation of your components quality and surface functionality as proof or assembly.
Surface quality becomes a manufacturing objective, and zero default a quality insurance. To answer all these needs our systems offers flexibility and automatism to fulfil the requirement as close as possible to the manufacturing areas.
- Roughness
- Default detection
- Planarity, co-planarity
- Dimensional measurement
EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.