françaisSurfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry

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Eotech will be present at MesurExpoVision 2010 from 1st to 3rd of June at Palais des expositions de la porte de Versailles in Paris
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New products and applications for dermo-cosmetic will be presented at In Cosmetics 2010
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EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.