Surfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry
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3D surface metrology - Microscopy > OPTOSURF
OPTOSURF
Interferometric Microscope option with near field measurement capability
- Control surface topography
- Profilometry microstructure
- Measuring range Z extent from 0.1 nm at 100 µm
- Control surface topography
- Profilometry microstructure
- Measuring range Z extent from 0.1 nm at 100 µm
EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.