françaisSurfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry

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MesurExpo in Paris 23rd to 25th of October 2012
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SF2IC in Reims 3 to 5 of October 2012
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EMAA in Paris Palais des congres 12 to 14 October 2012
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ISBS 2012 28 to 30 of November 2012 in Copenhagen
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EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.