Surfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry
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3D surface metrology - Microscopy > Recherche
Recherche
Research
Research always requires very powerfull investigation instrument. They also requires simple to use instrument to be shared by most of the researchers. Technology innovation is our aim to provide to research the best tools. Our partnership with research are necessary to create innovation in our product and all our partners are contributing to it.
- 3D visualization
- 3D topography
- Fractal dimensions, wavelets
- Data export
Research always requires very powerfull investigation instrument. They also requires simple to use instrument to be shared by most of the researchers. Technology innovation is our aim to provide to research the best tools. Our partnership with research are necessary to create innovation in our product and all our partners are contributing to it.
- 3D visualization
- 3D topography
- Fractal dimensions, wavelets
- Data export
EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.