Surfaces metrology, roughness,profiles, 3D shape, displacement, photometry and colorimetry
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3D surface metrology - Interferometry > OPTOSURF
OPTOSURF
Multi-scale optical Profiler
- For measurements from nanometer to millimeter
- Phase shifting Interferometry
- Phase Contrast Interferometry
- Micro-fringe projection
- For measurements from nanometer to millimeter
- Phase shifting Interferometry
- Phase Contrast Interferometry
- Micro-fringe projection
EOTECH offers a wide range of products for measuring roughness, surface topography, shape, geometry, dimensions, displacement, vibrations, colour, lighting and signalisation for improving your process, control or inspection.